Recognition of linguistic patterns for the generation of ontologies applied in knowledge measurement

Authors

  • Héctor Gonzalo Rojas Pescio Ureus Tecnología Multimedia e Informática Ltda.
  • Verónica Alejandra Roa Petrasic Universidad de Santiago de Chile

Abstract

This article analyzes the main thematic areas related to the recognition of linguistic patterns for the generation of ontologies. It begins with an introduction to cognitive science as a scientific area that groups knowledge domains included in a proposed measurement model. Then, from the amplitude of the ontology concept, definitions are exposed according to the project’s theoretical framework as well as examples applied in current linguistic resources. It also describes the common characteristics and main concepts of pattern recognition systems (SRP) and their application in computational linguistics to finally conclude in the main aspects to be considered in the development of a recognition system of linguistic patterns. The article contributes to the exploration of new methodologies supported by ICT as a support to knowledge management in organizations with limited resources such as the micro, small, and medium-size enterprises.

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Author Biographies

  • Héctor Gonzalo Rojas Pescio, Ureus Tecnología Multimedia e Informática Ltda.

    Magíster en Ingeniería en Informática de la Universidad Andrés Bello. Ingeniero en Informática de la Universidad de Los Lagos. Licenciado en Organización y Gestión Tecnológica de la Universidad de Santiago de Chile.
    Gerente General Ureus Tecnología Multimedia e Informática Ltda.

  • Verónica Alejandra Roa Petrasic, Universidad de Santiago de Chile

    Doctor of Philosophy in Science and Technology Policy Studies, University of Sussex. Master of Science in Public Policies for Science, Technology and Innovation, University of Sussex. Ingeniera Civil Industrial y Licenciada en Ciencias de la Ingeniería de la Universidad de Santiago de Chile.
    Académica Jornada Completa Departamento Tecnologías de Gestión, Universidad de Santiago de Chile.

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Published

2019-07-31

Issue

Section

Technology

How to Cite

Recognition of linguistic patterns for the generation of ontologies applied in knowledge measurement. (2019). People and Technology Management Journal, 12(35), 16. https://revistas.usach.cl/ojs/index.php/revistagpt/article/view/4001